Unveiling the charge distribution of a GaAs-based nanoelectronic device: A large experimental dataset approach

In quantum nanoelectronics, numerical simulations have become a ubiquitous tool.Yet the comparison with experiments is often done at simply boho classroom a qualitative level or restricted to a single device with a handful of fitting parameters.In this work, we assess the predictive power of these simulations by comparing the results of a single model with a large experimental dataset of 110 devices with 48 different geometries.The devices are quantum point contacts of various shapes and sizes made with electrostatic gates deposited on top of a high mobility GaAs/AlGaAs two-dimensional electron gas.

We study the pinch-off voltages applied on the gates to deplete the two-dimensional electron gas in various spatial positions.We argue that the pinch-off voltages are a very robust signature of the charge distribution in the device.The large experimental dataset allows us to critically review the modeling and arrive at a robust one-parameter model that can be dodge warlord for sale calibrated in situ, a crucial step for making predictive simulations.

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